Mikroskop：

SMZ-0745-U5 ee tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈

All-way bracket configuration, easy to detect when multiple angles viewing, force arm can be extended and shortened. A ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raanLuɔ̈ɔ̈i ka kɛ̈ɛ̈l juëc ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈lYe.

Ku ka tɛmɛ fotow ye cɔl screen HD, ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛm

Ka kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈kA wɛ̈t bɛ̈n looi në tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ.

Karakteristika mikroskop:

1. Optical parts of high quality coated with special membrane layer, casting the high quality optical images. 1. Optical parts of high quality coated with special membrane layer, casting the high quality optical images. 1. Optical parts of high quality coated with special membrane layer, casting the high quality optical images.
2. Ka tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
Image ye kɛnɛŋ ye kɛnɛŋ ye kɛnɛŋ ye kɛnɛŋ ye kɛnɛŋ ye kɛnɛŋ ye kɛnɛŋ ye kɛnɛŋ ye
3. Luɔ̈ɔ̈i de kä ye kek tɔ̈ɔ̈u në 0.7X ~ 4.5X (6.3: 1), ye kek tɔ̈ɔ̈u në 7X ~ 45X
(Kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye)
4. ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
26 mm～287mm， Lɔ̈k tɛ̈n yenë yïn luɔ̈ɔ̈i thïn.
5. tɛ̈ɛ̈r kɔrɔ ye 45 ° ye tɛ̈ɛ̈r, ye tɛ̈ɛ̈r ye tɛ̈ɛ̈r ye tɛ̈ɛ̈r ye tɛ̈ɛ̈r
Image cɛl
6. Tɛ̈n yenë yen tɔ̈ɔ̈u thïn në ergonomic engineering yic, ye tɛ̈n yenë yen tɔ̈ɔ̈u thïn në kaam juëc yiic
7. Variable handwheel horizontal (axial) bilateral setup, operation easy and comfortable, variable repeat precision high
8. Kuen juëc ye kek looi, ku bɛ̈n ya looi.

Lappol:

A be tɔ̈u në luɔɔi de telefɔn, electronic components appearance detection, SMT appearance detection, semiconductor chip observation, hardware materials observation, product maintenance and line welding.